Fundamental Understanding of Factors Impacting Reliability in High Power GaN-Based Electronic Devices
Program
Fulbright Visiting Scholar Program
Grant Activity Type
Research
Specialization
Electrical Engineering
Dates
-
Scholar type
Non-U.S. (Visiting) Scholar
Project Title
Fundamental Understanding of Factors Impacting Reliability in High Power GaN-Based Electronic Devices
Host Institutions
Host Department
Woodruff School of Mechanical Engineering