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David Mele

Home Country

Fundamental Understanding of Factors Impacting Reliability in High Power GaN-Based Electronic Devices

Program

Fulbright Visiting Scholar Program

Program Country

Grant Activity Type

Research

Discipline

Specialization

Electrical Engineering

Academic Year

Dates

October 2014 - August 2015

Flex

No

Scholar type

Non-U.S. (Visiting) Scholar

Project Title

Fundamental Understanding of Factors Impacting Reliability in High Power GaN-Based Electronic Devices

Scholar Information

Grantee

David Mele

Title

Ph.D. Candidate

Institution

National Center of Scientific Research

Host Institutions

Institution

Georgia Institute of Technology

Faculty

Samuel Graham

Host Department

Woodruff School of Mechanical Engineering